A study published in Molecules and led by researchers from the Changchun Institute of Optics, Fine Mechanics and Physics (CIOMP) of the Chinese Academy of Sciences demonstrated how deep learning can ...
In the context of the assessment and validation of plasma-generated atomic oxygen (AO), within the framework of EU Horizon MOXY project, this study compared three non-invasive methodologies for the ...
Researchers report an improved YOLO model that detects small PCB surface defects with 90.63% sensitivity while reducing model ...
A new review describes how AI-based imaging and sensing technologies can detect packaging film defects that traditional meat ...
A new technical paper titled “A Universal AI-Powered Segmentation Model for PCBA and Semiconductor” was published by researchers at Nordson Corporation. “This paper introduces a novel universal deep ...
Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
What if manufacturing companies could pinpoint the exact cause of a defect the moment it occurs, preventing costly production delays and ensuring top-notch quality? Generative artificial intelligence ...
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